发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent the effect of contamination in an LP-CVD process conducted, after a processing using heavy metals. SOLUTION: Before conducting a processing using heavy metals, an insulating film is formed on the bottom surface side of a structure that will later become a semiconductor device. After the processing using heavy metal has been finished, the heavy metals attached to the surface of the insulating film are removed.
申请公布号 JP2002164350(A) 申请公布日期 2002.06.07
申请号 JP20000360989 申请日期 2000.11.28
申请人 OKI ELECTRIC IND CO LTD 发明人 NAGATA TOSHIO
分类号 H01L21/28;H01L21/285;H01L21/304;H01L21/306;H01L21/3205;H01L21/8242;H01L23/52;H01L27/108;(IPC1-7):H01L21/320;H01L21/824 主分类号 H01L21/28
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