发明名称 Cleaning sheet and method of cleaning a substrate
摘要 <p>A cleaning sheet comprising a cleaning layer and a releasable protective film laminated on the cleaning layer, wherein each of the relative intensities of the fragment ions of CH 3 Si + , C 3 H 9 Si + , C 5 H 15 Si 2 O + , C 5 H 15 Si 3 O 3 + , C 7 H 21 Si 3 O 2 + , CH 3 SiO - , CH 3 SiO 2 - and Si + in the cleaning layer, when the protective film is peeled off the cleaning layer, is 0.1 or less according to time-of-flight secondary ion mass spectrometry, relative to C 2 H 3 + in the case of positive ion or O - in the case of negative ion.</p>
申请公布号 EP1468752(A2) 申请公布日期 2004.10.20
申请号 EP20040008902 申请日期 2004.04.14
申请人 NITTO DENKO CORPORATION 发明人 TERADA, YOSHIO;NAMIKAWA, MAKOTO;UENDA, DAISUKE;FUNATSU, ASAMI
分类号 H01L21/306;B08B1/00;B08B7/00;C11D3/16;C11D17/04;H05K3/26;(IPC1-7):B08B7/00 主分类号 H01L21/306
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