发明名称 PROBE FOR SCANNING PROBE MICROSCOPE AND METHOD FOR PRODUCINGTHE SAME, AND SCANNING PROBE MICROSCOPE INCLUDING THE PROBE AND MOLECULAR PROCESSING METHOD USING THE SCANNING PROBE MICROSCOPE
摘要 There is provided a probe for a scanning probe microscope, comprising: a proximal end; and a distal tip portion, wherein the distal tip portion has a tip surface which faces a fixed sample, and at least one monolayer is formed at least on the tip surface, and a molecule having a chemical sensor function or catalytic function is placed in or on an outermost monolayer above the tip surface. There is provided a probe for a scanning probe microscope, comprising: a cover layer containing an electrically conductive polymer; and a catalyst in the cover layer, the catalyst being selected from a group consisting of inorganic catalysts and organic catalysts. There are provided a scanning probe microscope equipped with the above probe, and a molecule processing method using such a scanning probe microscope.
申请公布号 CA2392004(C) 申请公布日期 2005.11.29
申请号 CA20012392004 申请日期 2001.09.20
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NAKAGAWA, TOHRU;YUKIMASA, TETSUO
分类号 G01N33/53;G01N33/566;G01Q60/24;G01Q60/38;G01Q60/42;G01Q70/16;G01Q70/18;(IPC1-7):G01N13/16;G12B21/08 主分类号 G01N33/53
代理机构 代理人
主权项
地址