DEFECT DETECTION METHOD, DEFECT INSPECTION METHOD, DEFECT DETECTION DEVICE, DEFECT INSPECTION DEVICE, DEFECT DETECTION PROGRAM AND RECORDING MEDIUM FOR RECORDING PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide an optical panel inspection method capable of performing properly rank determination based on only display defects having a prescribed area or more.

SOLUTION: An image by a liquid crystal panel is imaged, to thereby acquire image data (inspection image acquisition process). Brightness data of each pixel of a point defect or a strain defect having a smaller area than an irregular defect in the image data acquired in the inspection image acquisition process is replaced with an interpolation value based on brightness data of a peripheral pixel, to thereby repair the non-evaluation object defect species (point/strain defect repair process ST200). An irregular defect is detected in image data wherein the point/strain defect is repaired in the point/strain defect repair process ST200 (irregular defect detection process ST300). Rank determination of the liquid crystal panel is performed based on a defect area of the irregular defect and average brightness detected in the irregular defect detection process (ST300) (rank determination process ST400).

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