发明名称 |
Diagnostics for industrial process control and measurement systems |
摘要 |
A field device includes diagnostic circuitry adapted to measure a characteristic related to a process control and measurement system. The measured characteristic is used to provide a diagnostic output indicative of a condition of the process control and measurement system. The measured characteristic can be provided to a diagnostic module that operates upon the measured characteristic to predict, or otherwise model, a condition of the process control and measurement system.
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申请公布号 |
US2002169582(A1) |
申请公布日期 |
2002.11.14 |
申请号 |
US20010855179 |
申请日期 |
2001.05.14 |
申请人 |
ERYUREK EVREN;BORGESON DALE W.;PELUSO MARCOS;ROME GREGORY H.;ROPER WESTON R. |
发明人 |
ERYUREK EVREN;BORGESON DALE W.;PELUSO MARCOS;ROME GREGORY H.;ROPER WESTON R. |
分类号 |
G05B23/02;(IPC1-7):G06F11/30;G06F15/00;G21C17/00 |
主分类号 |
G05B23/02 |
代理机构 |
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