发明名称 Diagnostics for industrial process control and measurement systems
摘要 A field device includes diagnostic circuitry adapted to measure a characteristic related to a process control and measurement system. The measured characteristic is used to provide a diagnostic output indicative of a condition of the process control and measurement system. The measured characteristic can be provided to a diagnostic module that operates upon the measured characteristic to predict, or otherwise model, a condition of the process control and measurement system.
申请公布号 US2002169582(A1) 申请公布日期 2002.11.14
申请号 US20010855179 申请日期 2001.05.14
申请人 ERYUREK EVREN;BORGESON DALE W.;PELUSO MARCOS;ROME GREGORY H.;ROPER WESTON R. 发明人 ERYUREK EVREN;BORGESON DALE W.;PELUSO MARCOS;ROME GREGORY H.;ROPER WESTON R.
分类号 G05B23/02;(IPC1-7):G06F11/30;G06F15/00;G21C17/00 主分类号 G05B23/02
代理机构 代理人
主权项
地址