发明名称 METHOD OF MANUFACTURING SOI SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing an SOI substrate with high throughput. SOLUTION: A semiconductor layer separated from a semiconductor substrate is transferred to a supporting substrate, thereby manufacturing an SOI substrate. First, the semiconductor substrate serving as a base of the semiconductor layer is prepared. An embrittlement layer is formed in a region at a prescribed depth of the semiconductor substrate, and an insulating layer is formed on a surface of the semiconductor substrate. After bonding the semiconductor substrate and a supporting substrate with the insulating layer interposed therebetween, the semiconductor substrate is selectively irradiated with a laser beam; accordingly, embrittlement of the embrittlement layer progresses. Then, using a physical method or heat treatment, the semiconductor substrate is separated; at that time, the region where the embrittlement has progressed in the embrittlement layer serves as a starting point. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009049387(A) 申请公布日期 2009.03.05
申请号 JP20080184536 申请日期 2008.07.16
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ONUMA HIDETO
分类号 H01L21/02;G02F1/1368;H01L21/20;H01L21/265;H01L21/336;H01L27/12;H01L29/786;H01L51/50 主分类号 H01L21/02
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