发明名称 |
TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A transistor and a method for manufacturing the same are provided to allow a semiconductor substrate to have the same effect to an LDD region due to positive fixed oxidization charges in a channel. CONSTITUTION: A method for manufacturing a transistor forms a gate oxide film(12) in a semiconductor substrate(11) in which a P type or a P well is provided. After a conductive layer for gate is deposited on the gate oxide film(12), the conductive layer is patterned by patterning process to form a gate electrode(13). An n type high-concentration impurity is injected into the semiconductor substrate(11) to form a source/drain(14). Positive fixed charges are charged up to the gate oxide film(12) using plasma containing NH3 or implant containing hydrogen or nitrogen. The charged-up positive fixed charges are diffused into the side surface by a thermal process so that they can overlap the gate electrode(13). |
申请公布号 |
KR100252545(B1) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19960068899 |
申请日期 |
1996.12.20 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
CHOI, DUCK-SUNG |
分类号 |
H01L21/334;H01L21/265;H01L21/336;H01L21/8238;H01L27/092;H01L29/49;H01L29/51;H01L29/78 |
主分类号 |
H01L21/334 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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