发明名称 Polishing pad conditioning system and method
摘要 A system and method for conditioning a polishing pad12 in a chemical-mechanical polishing process for polishing a semiconductor wafer. The conditioning system includes a conditioning device 20 into which a plurality of removable inserts 24 are inserted. The inserts each have a tip 26 comprising a conditioning material. During operation, the plurality of insert tips 26 contact the polishing pad 12 to condition the polishing pad 12, thereby enhancing the uniformity of wafers polished by the polishing pad and reducing damage to polished wafers.
申请公布号 US5851138(A) 申请公布日期 1998.12.22
申请号 US19970906584 申请日期 1997.08.05
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 HEMPEL, JR., EUGENE O.
分类号 B24B37/04;B24B53/007;(IPC1-7):B24B53/00 主分类号 B24B37/04
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