发明名称 Method of producing semiconductor device using an adsorption layer
摘要 An impurity adsorption layer is formed on a substrate surface and solid-phase thermal diffusion is carried out to form source and drain regions for a metal-insulator-semiconductor field-effect-transistor having lightly doped drain structure or double doped drain structure. The thus formed impurity-doped region is ultrashallow, thereby producing high speed semiconductor devices of small dimensions.
申请公布号 US5851909(A) 申请公布日期 1998.12.22
申请号 US19930006152 申请日期 1993.01.19
申请人 SEIKO INSTRUMENTS INC. 发明人 KAMIYA, MASAAKI;AOKI, KENJI;SAITO, NAOTO
分类号 H01L21/225;H01L21/336;H01L29/08;H01L29/78;(IPC1-7):H01L21/225 主分类号 H01L21/225
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