发明名称 |
POSITIVE TYPE RESIST COMPOSITION FOR ELECTRON BEAM OR X- RAY |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive type resist composition for electron beams or X-rays having high sensitivity and high resolution and excellent in stability of PED. SOLUTION: The positive type photoresist composition contains (a) a compound which generates an acid when irradiated with electron beams or X-rays, (b) a resin having the residue of a compound having a lower ionization potential than p-ethylphenol in a group released by the action of the acid and having a velocity of dissolution in an alkali developing solution increased by the action of the acid and (c) a solvent. |
申请公布号 |
JP2002202608(A) |
申请公布日期 |
2002.07.19 |
申请号 |
JP20000402591 |
申请日期 |
2000.12.28 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
SASAKI TOMOYA;MIZUTANI KAZUYOSHI;SHIRAKAWA KOJI |
分类号 |
C08K5/42;C08L25/18;C08L101/02;G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
C08K5/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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