发明名称 SEMICONDUCTOR MEMORY DEVICE HAVING A BURIED CAPACITOR AND FABRICATING METHOD THEREOF
摘要 The method comprises a stage which grows n type epitaxial layer, makes p type well on some part of the n type layer, isolates each of memory elements, grows gate oxide film on a front face, and makes polysilicon for a restricted gate in a gate region, a stage which makes p type source region and p type drain region, coats a protecting film in a front face and makes wiring.
申请公布号 KR940002836(B1) 申请公布日期 1994.04.04
申请号 KR19910007880 申请日期 1991.05.15
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 JONG, WON - YONG;SHIN, DONG - JIN
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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