| 摘要 |
Certain embodiments of the present invention relate to techniques for tuning or measuring operational features of amplifiers, such as the transconductance of operational transconductance amplifiers (OTAs) and the gain of variable gain amplifiers (VGAs). Each technique employs (at least) two phases that involve the application of different input voltages. The results of the multiple phases are then combined to generate a final result that negates or reduces the effects of real-world properties such as finite output impedances and offset voltages.
|
