| 发明名称 |
PULSED LASER ATOM PROBE AND ASSOCIATED METHODS |
| 摘要 |
The present invention is directed generally toward atom probe specimen shape, atom probe control, data and associated systems and methods. Aspects of the invention are directed toward improving mass resolution by utilizing a pulsed laser system configured to reduce the laser spot size to 5 microns or less. |
| 申请公布号 |
WO2008109875(A1) |
申请公布日期 |
2008.09.12 |
| 申请号 |
WO2008US56326 |
申请日期 |
2008.03.07 |
| 申请人 |
IMAGO SCIENTIFIC INSTRUMENTS CORPORATION;BUNTON, JOSEPH, HALE |
发明人 |
BUNTON, JOSEPH, HALE |
| 分类号 |
G01N23/00 |
主分类号 |
G01N23/00 |
| 代理机构 |
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代理人 |
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| 地址 |
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