发明名称 TESTING DEVICE FOR TESTING DEVICE UNDER TEST, HAVING SWITCH FOR SELECTING DIFFERENT PATHS
摘要 PROBLEM TO BE SOLVED: To provide a device for testing an opto-electric device or an optical device, capable of periodically carrying out complete calibration without performing light measurement. SOLUTION: This testing device for testing a DUT (Device Under Test) comprises a first electric terminal and a first optical terminal. The device has a first electric circuit port and a first optical circuit port. The first optical circuit port is connected to the first optical terminal by an optical line. The device comprises a first electric switch having first, second and third switch ports. The first switch is adapted to connect the first switch port selectively to the second switch port or the third switch port. Further, a first electric line is provided for connecting the second switch port to the first electric terminal, and a second electric line is provided for connecting the third switch port to the first electric circuit port. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009047690(A) 申请公布日期 2009.03.05
申请号 JP20080198183 申请日期 2008.07.31
申请人 AGILENT TECHNOL INC 发明人 MAESTLE RUEDIGER
分类号 G01M11/00 主分类号 G01M11/00
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