| 发明名称 |
PROBES FOR INSPECTION SYSTEM FOR SUBSTANTIALLY ROUND HOLE |
| 摘要 |
Probes for an inspection system for a substantially round hole in a material are provided. One version of the probe may include a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole; and a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole. |
| 申请公布号 |
US2016161300(A1) |
申请公布日期 |
2016.06.09 |
| 申请号 |
US201414559278 |
申请日期 |
2014.12.03 |
| 申请人 |
General Electric Company |
发明人 |
Bergman Robert William;Batzinger Thomas James |
| 分类号 |
G01D11/30;G01N29/24;G01M15/14;G01N27/90 |
主分类号 |
G01D11/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A probe for an inspection system for a substantially round hole in a material, the probe comprising:
a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole; and a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole. |
| 地址 |
Schenectady NY US |
