发明名称 METAL-INSULATOR-METAL STRUCTURE AND METHOD FOR FORMING THE SAME
摘要 A semiconductor structure and a forming method thereof are provided. The method for manufacturing a semiconductor structure includes: forming a bottom electrode layer over a substrate; and forming a first passivation layer over the bottom electrode layer by a first atomic layer deposition process. The method for manufacturing a semiconductor structure further includes: forming a dielectric layer over the first passivation layer by a second atomic layer deposition process; and forming a second passivation layer over the dielectric layer by a third atomic layer deposition process. The method for manufacturing a semiconductor structure further includes forming a top electrode layer over the second passivation layer.
申请公布号 KR20160067729(A) 申请公布日期 2016.06.14
申请号 KR20150155842 申请日期 2015.11.06
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN HSING LIEN;TSAI CHIA SHIUNG;TSAI CHENG YUAN;CHU HUEY CHI;TRINH HAI DANG;CHIANG WEN CHUAN;TSENG WEI MIN
分类号 H01L49/02;H01L21/203;H01L21/28;H01L27/24 主分类号 H01L49/02
代理机构 代理人
主权项
地址