发明名称 | Methods of forming magnetic memory cells | ||
摘要 | Methods of forming memory cells, magnetic memory cell structures, and arrays of magnetic memory cell structures are disclosed. Embodiments of the methods include patterning a precursor structure to form a stepped structure including at least an upper discrete feature section and a lower feature section with a broader width, length, or both than the upper discrete feature section. The method uses patterning acts directed along a first axis, e.g., an x-axis, and then along a second axis, e.g., a y-axis, that is perpendicular to or about perpendicular to the first axis. The patterning acts may therefore allow for more unifoimity between a plurality of formed, neighboring cell core structures, even at dimensions below about thirty nanometers. Magnetic memory structures and memory cell arrays are also disclosed. | ||
申请公布号 | US9373775(B2) | 申请公布日期 | 2016.06.21 |
申请号 | US201213614212 | 申请日期 | 2012.09.13 |
申请人 | Micron Technology, Inc. | 发明人 | Sandhu Gurtej S.;Kula Witold;Kinney Wayne I. |
分类号 | H01L27/20;H01L43/08;H01L43/12;H01L27/22 | 主分类号 | H01L27/20 |
代理机构 | TraskBritt | 代理人 | TraskBritt |
主权项 | 1. A method of forming a magnetic memory cell, the method comprising: forming a precursor structure on a base, the precursor structure comprising a lower section comprising a magnetic material, an upper section comprising another magnetic material, and a non-magnetic material between the lower section and the upper section; patterning the upper section using an ion beam directed parallel to an x-axis to form an upper elongate feature section defining an upper feature width; forming a spacer on the upper elongate feature section to define a broader feature pattern; transferring the broader feature pattern to the non-magnetic material and the lower section to form a lower elongate feature section; patterning the upper elongate feature section using an ion beam directed parallel to a y-axis about perpendicular to the x-axis to form an upper discrete feature section; forming another spacer on the upper discrete feature section to define another broader feature pattern; and transferring the another broader feature pattern to the lower elongate feature section to form a lower discrete feature section. | ||
地址 | Boise ID US |