发明名称 粒子測定装置
摘要 PROBLEM TO BE SOLVED: To provide a particle measuring apparatus for measuring a particle with high accuracy.SOLUTION: A particle measuring apparatus 15a comprises: at least two electrodes 1a and 1b; a measuring section 2 for measuring particles included in a sample; a sample introduction part 6a for introducing the sample into the own apparatus; and at least one upstream flow path 4a in which the sample is flowed. The sample introduction part 6a comprises the electrode 1a.
申请公布号 JP5944118(B2) 申请公布日期 2016.07.05
申请号 JP20110150346 申请日期 2011.07.06
申请人 シャープ株式会社 发明人 高橋 克佳;北川 俊明
分类号 G01N15/12 主分类号 G01N15/12
代理机构 代理人
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