发明名称 METHOD AND DEVICE FOR CHARACTERIZING AN ELECTRON BEAM
摘要 A device for detecting X-rays radiated out of a substrate surface, said device comprising at least one X-ray detector, a resolver grating and a modulator grating, said resolver grating with at least one opening facing towards said X-ray detector is arranged in front of said X-ray detector. Said modulator grating is provided between said resolver grating and said substrate at a predetermined distance from said resolver grating and said substrate, where said modulator grating having a plurality of openings in at least a first direction, wherein said x-rays from said surface is spatially modulated with said modulator grating and resolver grating.
申请公布号 WO2016116363(A1) 申请公布日期 2016.07.28
申请号 WO2016EP50742 申请日期 2016.01.15
申请人 ARCAM AB 发明人 LOCK, TOMAS
分类号 B29C67/00;B23K15/00;G01T1/29;H01J37/30;H01J37/304 主分类号 B29C67/00
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