| 发明名称 |
SYSTEM AND METHOD FOR DETECTING A DEFECT IN A STRUCTURE MEMBER |
| 摘要 |
A method for detecting a defect in a structure member includes exciting a structure member by applying an excitation signal to the structure member, applying an optical signal to the excited structure member and capturing a reflected optical signal formed by a reflection of the applied optical signal by the excited structure member, and processing the reflected optical signal to determine one or more defects in the structure member. |
| 申请公布号 |
US2016238534(A1) |
申请公布日期 |
2016.08.18 |
| 申请号 |
US201514624728 |
申请日期 |
2015.02.18 |
| 申请人 |
City University of Hong Kong |
发明人 |
Lau Denvid;Cheng Tin Kei |
| 分类号 |
G01N21/70;G01N21/88 |
主分类号 |
G01N21/70 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for detecting a defect in a structure member comprising the steps of:
exciting a structure member by applying an excitation signal to the structure member; applying an optical signal to the excited structure member and capturing a reflected optical signal formed by a reflection of the applied optical signal by the excited structure member; and processing the reflected optical signal to determine one or more defects in the structure member. |
| 地址 |
Kowloon HK |
