发明名称 Low resistance Schottky diode on polysilicon/metal-silicide.
摘要 <p>A Schottky diode is fabricated according to the following steps: forming a layer of metal-silicide on an underlying dielectric layer, forming a polysilicon layer on the upper surface of the metal-silicide layer, forming a second dielectric layer on the upper surface of the polysilicon layer and patterning the second dielectric layer to create a contact window through the second dielectric layer to an exposed surface region of the polysilicon layer, and forming a metal contact to the exposed surface region.</p>
申请公布号 EP0057135(A2) 申请公布日期 1982.08.04
申请号 EP19820400107 申请日期 1982.01.21
申请人 FAIRCHILD CAMERA & INSTRUMENT CORPORATION 发明人 VORA, MADHUKAR B.;HINGARH, HEMRAJ K.
分类号 H01L21/329;H01L21/70;H01L21/84;H01L29/04;H01L29/47;H01L29/861;H01L29/872;(IPC1-7):01L27/12;01L29/48 主分类号 H01L21/329
代理机构 代理人
主权项
地址