| 摘要 |
A method and apparatus for measuring the thickness corrected moisture ratio of a material, particularly organic material, comprising transmitting microwaves and measuring therewith the damping (A) and phase change (F1) of the microwaves upon their transmission through the material. According to the invention (Ww/Y) is calculated from the expression A=(Ww/Y)x xk1+k3xt, where t is the thickness of the material (10) and where k1 and k3 are constants and the term Ww/Y is the weight of the water in the material per unit area. In addition, the term (Wd/Y) is determined from the expression F1=(Ww/Y)xk4+(Wd/Y)xk5+k6xt in which expression the aforedetermined term Ww/Y is used. The term Wd/Y is the weight of the material in a dry state per unit area and k4, k5, k6 are constants. The moisture ratio is obtained in a known manner through the quotient (Ww/Y)/(Wd/Y). In this way the effect of the material thickness on damping (A) and phase change (F1) is included in the determination of the moisture ratio of the material. |
