发明名称 |
MANUFACTURE OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE:To eliminate both of the addition of impurity element of III-group or V-group and the high temperature heat treatment of a substrate by a method wherein the surface of a p-type silicon substrate is heated by a laser beam to form a p-n junction. CONSTITUTION:A silicon nitride film 2 is formed on the surface of a p-type silicon substrate 1 to improve a heating efficiency. Long time heat treatment at about 450 deg.C is carried out to create oxygen donors and convert the p-type silicon substrate 1 into the n-type silicon substrate. The substrate 1 is locally heated by a heating source 3 to create oxygen donors. The heated region 4 in which the oxygen donors are created becomes high concentration n-type. Short time heat treatment at about 650 deg.C is carried out to eliminate the oxygen donors and convert both of the heated region 4 and the silicon substrate 1 into p-type. Finally, short time heat treatment at about 450 deg.C is carried out to activate the oxygen donors in the heated region 4 and convert the heated region 4 into n-type. Thus, a p-n junction consisting of the n-type heated region 4 and the p-type silicon substrate 1 can be formed. |
申请公布号 |
JPS61220340(A) |
申请公布日期 |
1986.09.30 |
申请号 |
JP19850061694 |
申请日期 |
1985.03.26 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
MADA YOICHI;WADA KAZUMI;INOUE NAOHISA |
分类号 |
H01L21/324;H01L21/268;H01L21/322 |
主分类号 |
H01L21/324 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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