发明名称 IMPROVED DEFECT LIST, METHOD FOR RECOGNIZING DISK AND DEFECT SECTOR LOCATION AND METHOD FOR MANAGING DEFECT
摘要 PURPOSE: A detect managing method is provided to reduce a capacity for a detect management of a driver by expressing location information of a detect sector in a detect block in a bit map form. CONSTITUTION: In a method for performing a disk detect management, in case where the number of detective blocks is less than that capable of being managed by a defect block table, the defect block table is recorded to a defect management region so as to perform a detect management. In case where the number of detective blocks is more than that capable of being managed by a defect block table, the defect block bit map is recorded to the defect management region so as to perform the detect management.
申请公布号 KR20000024996(A) 申请公布日期 2000.05.06
申请号 KR19980041859 申请日期 1998.10.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YOUNG YOUN;OH, GI HWAN;LEE, KYUNG GEUN;SHIM, JAE SUNG
分类号 G11B20/12;(IPC1-7):G11B20/12 主分类号 G11B20/12
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