发明名称 TEST WAVE GENERATING METHOD, TEST CONTROL DEVICE, AND CONTROL INSTRUCTING DEVICE
摘要 PROBLEM TO BE SOLVED: To implement a test wave generating method capable of generating test waves for insertion at the time when a request for the insertion of test waves for insertion is inputted during steady operation. SOLUTION: At the time of receiving the transfer of the waveform parameters of test waves for insertion from a host computer 81, a control part 14 generates test waves for insertion in a test wave generating part 1 by outputting one cycle of waveform parameters of test waves for insertion to the test wave generating part 1 and a level comparator 13 at every completion timing of one cycle outputted from the level comparator 13. Waveforms of shorter cycle or longer cycle than that of, for example, ordinary test waves are used as the test waves for insertion.
申请公布号 JP2000180327(A) 申请公布日期 2000.06.30
申请号 JP19980351125 申请日期 1998.12.10
申请人 SAGINOMIYA SEISAKUSHO INC 发明人 UNO HIROSHI
分类号 G01N3/32;(IPC1-7):G01N3/32 主分类号 G01N3/32
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