| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe for inspection used for an inspection bed, or the like, for an electrical element and preventing production of scratch action between components causing generation of particles that deteriorate the stylus. SOLUTION: This probe 10'' is assembled the steps: first, a tubular housing 16 with an open end is formed while a plunger 12 is formed, having a cylindrical inner portion 14 slide-fittable into the tubular housing 16 and a cylindrical outer portion 18 smaller in diameter than the inner portion 14; then, a spring 26 and the inner portion 14 are inserted in order into the housing 16, and a shoulder part 20 is positioned below the open end of the housing 16, with the spring 26 being compressed by the inner portion 14; and an area of the housing 16 between the shoulder part 20 and the open end is narrowed down by swaging or the like to form a holding/slide support part 40 of a small diameter.
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