| 摘要 |
PROBLEM TO BE SOLVED: To provide a result of evaluating flaw detection with high precision, for a TOFD method. SOLUTION: A plurality of D scope images are stored in a storage device in which the same object is separately measured with a pair of probe and measuring device under the same inspection condition. Two D-scope images out of the plurality of D-scope images stored in the storage device are displayed on a display device. A command for evaluating/calculating defect is inputted from an input device for dissimilar defect fringes of the two D-scope images. A calculation device evaluates all defect fringes, for defect, related to the D- scope image acquired at a first measurement, which is stored in the storage device. Related to D-scope images acquired at second or following measurements, the evaluation calculation is made with such defect fringe as indicated from the input device, whose result is stored in the storage device.
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