发明名称 |
METHOD OF CALCULATING OCCURRENCE FREQUENCY OF SEQUENCE, METHOD OF CALULATING DEGREE OF ISOLATION AND METHOD OF ESTIMATING DEGREE OF ADEQUACY FOR PRIMER |
摘要 |
It is intended to support a unique design of a primer. To calculate an indication showing the occurrence frequency of a sequence in a genome sequence, the occurrence frequencies of partial sequences having a definite length in the genome sequences are calculated. Then the occurrence of frequency of each partial sequence of the definite length is stored in an incidence/isolation degree table (16). Concerning each partial sequence of the definite length, a degree of isolation i, which means that j mutation indicating the conversion of j bases (j=<i-1) does not occur in the genome sequence but i mutation indicating the conversion of i bases occurs in the genome sequence, is calculated. Then the degrees of isolation of the partial sequences of the definite length are stored in the incidence/isolation degree table (16). In a visualization processing portion (18), respective bases are clolored in a definite manner based on the occurrence of frequency and/or the degree of isolation of each base to give an image showing the genome sequence. <IMAGE>
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申请公布号 |
EP1460561(A1) |
申请公布日期 |
2004.09.22 |
申请号 |
EP20020793448 |
申请日期 |
2002.12.27 |
申请人 |
TOUDAI TLO, LTD. |
发明人 |
MORISHITA, SHINICHI;YAMADA, TOMOYUKI |
分类号 |
G06F17/30;G06F19/20;G06F19/22;(IPC1-7):G06F17/30;C12N15/00 |
主分类号 |
G06F17/30 |
代理机构 |
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主权项 |
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地址 |
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