| 摘要 |
A test apparatus for testing electronic devices is provided which includes a plurality of signal sources to supply an output signal to test electronic devices according to an input signal, a loop circuit to make the output signal loop and to input the looped signal to each of the signal sources having output the output signal as an input signal, a counter section to measure a period between inputting of the input signal and inputting the looped signal in each of the signal sources, and a controlling section to control timing at which each of the signal sources supplies the output signal so that a period measured by the counter section in each of the signal sources be substantially same.
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