发明名称 VARIABLE RESISTANCE NON-VOLATILE MEMORY DEVICES INCLUDING A UNIFORMLY NARROW CONTACT LAYER AND METHODS OF MANUFACTURING SAME
摘要 A phase changeable memory device is manufactured by forming at least one insulating layer on a substrate. A preliminary first electrode is formed on the insulating layer. The preliminary first electrode is partially etched to form a first electrode electrically connected to the substrate. After the preliminary first electrode is formed, both sidewalls of the preliminary first electrode are partially etched isotropically to form a first electrode having a uniform width and height. A phase changeable material layer pattern and a second electrode are subsequently formed on the first electrode. Related devices also are described.
申请公布号 US2008029754(A1) 申请公布日期 2008.02.07
申请号 US20070829556 申请日期 2007.07.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN CHUNG-KI;KIM TAE-EUN;YOON BYOUNG-MOON
分类号 H01L45/00 主分类号 H01L45/00
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