HIGH SPEED MEMORY DEVICE HAVING IMPROVED TESTABILITY BY LOW SPEED AUTOMATIC TEST EQUIPMENT AND INPUT-OUTPUT PIN CONTROL METHOD THEREOF

摘要

A high speed memory device capable of being tested easily using low speed ATE(Automatic Test Equipment) equipment and a method for controlling an input/output pin for the same are provided to perform unidirectional communication with the ATE through both of an 00B pin and a reflective 00B pin in a test mode. A bidirectional input/output pin is used for bidirectional communication. A mirrored bidirectional input/output pin has the same function as the bidirectional input/output pin. During normal operation, bidirectional communication with a host is performed through one of the bidirectional input/output pin and the mirrored bidirectional input/output pin. During test mode, unidirectional communication with test equipment(700) is performed through both of the bidirectional input/output pin and the mirrored bidirectional input/output pin.