发明名称 LATERAL SEMICONDUCTOR DEVICE WITH HIGH DRIVING CAPACITY USING TRENCH STRUCTURE
摘要 PROBLEM TO BE SOLVED: To further improve a driving capacity without increasing an element area, with respect to a lateral MOS with a high driving capacity, wherein the gate width per unit area is increased by forming a plurality of trenches horizontally in a gate length direction. SOLUTION: In the lateral MOS with a high driving capacity, where the gate width per unit area is increased by forming a plurality of trenches 007 horizontally in a gate length direction, as shown in figures (Fig.(a) is plan view and Fig.(b) is bird's-eye view), trench patterns are laid out so that all surfaces of trench uneven portions are [100], and gate surfaces are all set to [100]. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009049260(A) 申请公布日期 2009.03.05
申请号 JP20070215552 申请日期 2007.08.22
申请人 SEIKO INSTRUMENTS INC 发明人 RISAKI TOMOMITSU
分类号 H01L29/78 主分类号 H01L29/78
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