SURFACE DEFECT INSPECTING APPARATUS AND THE INSPECTING METHOD USING THE SAME

摘要

According to an embodiment of the present invention, disclosed is a surface defect inspecting method which photographs an image by irradiating light on an object material surface for an irradiation angle to be 40-50 degrees; determines that a doubtful defect portion is not a defect portion when the doubtful defect portion is lighter than a reference value in case the doubtful defect portion is in a photographed surface image; and determines that the doubtful defect portion is a defect portion when the doubtful defect portion is darker than the reference value.