发明名称 VISUAL INSPECTION APPARATUS FOR MOUNTING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To correctly extract shape images of bodies to be inspected, relieve operator's work o entering a color parameter and the like, and improve an arithmetic operation speed in a visual inspection apparatus for mounting substrates. SOLUTION: A color CCD and a white multi-optical axis illumination are set to obtain image data for every luminance information, every color information and every angle of illumination, so that inspection can be carried out in different manners of color inspection and luminance inspection. In the color inspection, color signal data is compressed by converting color data to R relative two color values. In the luminance inspection, an operator can select an optimum inspection image and an optimum inspection color.
申请公布号 JP2001324455(A) 申请公布日期 2001.11.22
申请号 JP20000180530 申请日期 2000.05.15
申请人 DEVICE LINK:KK 发明人 YOSHIDA TOMOICHIRO
分类号 G01B11/24;G01N21/956;H05K3/34;H05K13/08 主分类号 G01B11/24
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