发明名称 Semiconductor device having various threshold voltages and manufacturing same
摘要 An impurity for adjusting a threshold voltage is ion-implanted using, as masks, a resist for forming P--type diffusion layers, a resist for forming N+-type diffusion layers and N-type diffusion layers and a resist for forming P+-type diffusion layers and N-type diffusion layers. For this reason, a semiconductor device including first to third N-channel transistors and first and second P-channel transistors, all of which respectively have different threshold voltages, can be manufactured without using an additional resist except for the above resists. Therefore, an operating margin at a low voltage can be improved and data retention characteristics can be improved in a memory without causing an increase in cost, an increase in power consumption and the like.
申请公布号 US5580805(A) 申请公布日期 1996.12.03
申请号 US19940296038 申请日期 1994.08.25
申请人 SONY CORPORATION 发明人 KURODA, HIDEAKI
分类号 H01L27/088;G11C11/407;H01L21/265;H01L21/8234;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L27/088
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