发明名称 |
POLISHING PAD USED FOR CHEMICAL AND MECHANICAL POLISHING OF SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE: A polishing pad is provided to uniformly polish an entire semiconductor substrate through a control a polishing amount by establishing an area formed with holes or grooves in different conditions on a polishing face. CONSTITUTION: A polishing face polishes a surface of a semiconductor substrate to leave slurry. A first polishing face area(103) has a plurality of first parts containing the slurry with a first volume ratio with respect to a unit area of the polishing face and the plurality of first parts are formed in a first depth, a first width, and a first mutual distance(157) on the polishing face. A second polishing face area(105) has a plurality of second parts containing the slurry with a second volume ratio with respect to a unit area of the polishing area different from the first volume ratio and the second parts are formed in a second depth, a second width, and a second mutual distance(127). |
申请公布号 |
KR20000025003(A) |
申请公布日期 |
2000.05.06 |
申请号 |
KR19980041866 |
申请日期 |
1998.10.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, KYUNG HYUN |
分类号 |
B24B37/00;B24B37/04;B24B37/20;B24B37/26;H01L21/304;H01L21/306;H01L21/3105;(IPC1-7):H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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