| 摘要 |
The invention concerns a device for electromagnetic characterisation of a tested structure (2), by evaluating, on a predetermined frequency band, distribution parameters of said structure (2) and parameters characteristic of the spurious rays of said structure (2), comprising an electric signal generator (4), means (8) for transmitting said electric signal to the tested structure (2), means (6) for analysing the signal transmitted by the generator (4) and signals reflected by the structure (2) and signals transmitted by the structure (2), the analysing means (6) comprising means for calculating said parameters. In addition, the electric signal generator (4) is a pulsed signal generator whereof the spectrum is at least as broad as said predetermined frequency band, and the analysing means (6) comprise means for temporal filtering of the signals it receives, to eliminate spurious signals. |
