发明名称 |
On-chip variability impact simulation and analysis for circuit performance |
摘要 |
An apparatus, method and system for performing a race analysis on an integrated circuit design which includes incorporating effects of on-chip transistor gate length (Lgate) and resistance variations into the race analysis and modeling on circuit performance while taking into account intra-chip transistor Lgate spatial variability.
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申请公布号 |
US7272808(B1) |
申请公布日期 |
2007.09.18 |
申请号 |
US20050147782 |
申请日期 |
2005.06.08 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
SHARMA MAHESH S.;NEWMARK DAVID M. |
分类号 |
G06F9/45;G06F17/50 |
主分类号 |
G06F9/45 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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