发明名称 |
SPECIMEN EVALUATION METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a new evaluation method of an evaluation object having high selectivity and a reduced noise. <P>SOLUTION: In this specimen evaluation method for applying an AC voltage between a substrate electrode and a counter electrode provided on a substrate, and evaluating a specimen by observation of a signal acquired from a marker provided on the specimen bonded onto the substrate electrode, behavior of a mean value of the marker signal is observed by changing a frequency of the AC voltage. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
申请公布号 |
JP2009085634(A) |
申请公布日期 |
2009.04.23 |
申请号 |
JP20070252542 |
申请日期 |
2007.09.27 |
申请人 |
FUJITSU LTD;TECHNISCHE UNIV MUENCHEN |
发明人 |
ARINAGA KENJI;RANT ULRICH;SCHERER SIMON;PRINGSHEIM ERIKA |
分类号 |
G01N33/542;G01N21/78;G01N33/53 |
主分类号 |
G01N33/542 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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