发明名称 SPECIMEN EVALUATION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a new evaluation method of an evaluation object having high selectivity and a reduced noise. <P>SOLUTION: In this specimen evaluation method for applying an AC voltage between a substrate electrode and a counter electrode provided on a substrate, and evaluating a specimen by observation of a signal acquired from a marker provided on the specimen bonded onto the substrate electrode, behavior of a mean value of the marker signal is observed by changing a frequency of the AC voltage. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009085634(A) 申请公布日期 2009.04.23
申请号 JP20070252542 申请日期 2007.09.27
申请人 FUJITSU LTD;TECHNISCHE UNIV MUENCHEN 发明人 ARINAGA KENJI;RANT ULRICH;SCHERER SIMON;PRINGSHEIM ERIKA
分类号 G01N33/542;G01N21/78;G01N33/53 主分类号 G01N33/542
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