发明名称 APPARATUS, TEST APPARATUS AND METHOD FOR DETECTING A CHANGING POINT OF MEASURED SIGNAL
摘要 Provided is an apparatus comprising a delaying section that generates a plurality of delayed signals by delaying a single first input signal by different delay amounts; a first acquiring section that acquires each of a plurality of input second input signals at a first phase of a reference clock; a second acquiring section that acquires each of the plurality of second input signals at a second phase of the reference clock, which is different from the first phase; and a change point detecting section that detects a change point of one of the first input signal and a second input signal, based on values of the plurality of signals acquired by the first acquiring section and values of the plurality of signals acquired by the second acquiring section.
申请公布号 US2010019801(A1) 申请公布日期 2010.01.28
申请号 US20090357405 申请日期 2009.01.22
申请人 ADVANTEST CORPORATION 发明人 MIYAZAKI MASASHI
分类号 H03D13/00 主分类号 H03D13/00
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