发明名称 COLUMN REDUNDANCY CIRCUIT
摘要 PURPOSE: A column redundancy circuit is provided to reduce a column enable time by comparing addresses during a clock and then outputting the compared result during another clock. CONSTITUTION: A column redundancy circuit includes the first and second address comparators(10,30), a fault address storing portion(20), comparison result output portion(40) and a decoder(50). The first address comparator compares an external address with a reference address in response to an internal clock signal if the external address has a fault. The second address comparator compares the external address increased one by one with the reference address in response to the an internal clock signal delayed for a predetermined time if the external address has a fault. The fault address storing portion stores an address of a failed memory cell. The comparison result output portion outputs the comparison result of the first and second address comparison portions. The decoder activates a designated column or redundancy column in response to an output signal of the comparison result output portion.
申请公布号 KR20010010158(A) 申请公布日期 2001.02.05
申请号 KR19990028884 申请日期 1999.07.16
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, YUN SAENG
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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