发明名称 DEBUG DEVICE
摘要 PROBLEM TO BE SOLVED: To extend a break function by using an external circuit in a debug device using an on-chip debug function. SOLUTION: Various buses 15 are pulled out of a target board 10 on which a microcomputer 11 incorporating a debug circuit 11b for realizing an on-chip debug function is mounted, and connected to a break board 30. The break board 30 is provided with a break condition storing part 31 and a break signal generating part 32. A break condition is written from a debugger 20 side through the debug circuit 11b, a CPU 11a, and the various buses 15 in a break condition storing part 31. Afterwards, a user program stored in an ROM 12 is executed. A break signal generating part 32 monitors a signal on the various buses 15, and when the signal on the various buses 15 is made coincident to the break condition, the break signal generating part 32 outputs a break generation signal 30a. Then, the execution of a user program is allowed to break (stop) based on the break generation signal 30a.
申请公布号 JP2002202900(A) 申请公布日期 2002.07.19
申请号 JP20000403225 申请日期 2000.12.28
申请人 SEIKO EPSON CORP 发明人 KUDO MAKOTO
分类号 G06F11/28;G06F11/22;G06F11/26;G06F11/36;G06F15/78 主分类号 G06F11/28
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