| 摘要 |
<p>The present invention relates to a method and a corresponding system (10) for testing an analog signal under test (12) using knowledge of at least one parameter of said signal under test (12), said method comprising the steps of: generating a reference signal (16) using said knowledge of at least one parameter of said signal under test (12), combining said generated reference signal (16) with said signal under test (12), resulting in a combination signal (20), and evaluating said combination signal (20) for testing said signal under test (12).</p> |
