发明名称 Devices for Probe Microscopy
摘要 An atomic force microscope sensing structure includes a substrate, a flexible membrane and an actuating element. The flexible membrane has a first end that is clamped to the substrate and an opposite second end that is clamped to the substrate. A central portion of the membrane and the substrate define a first gap width therebetween. A peripheral portion of the membrane and the substrate define a second gap width therebetween. The first gap width is different from the second gap width. The actuating element is disposed at least adjacent to the first end and the second end and is configured to displace the membrane relative to the substrate.
申请公布号 US2008168830(A1) 申请公布日期 2008.07.17
申请号 US20070838833 申请日期 2007.08.14
申请人 GEORGIA TECH RESEARCH CORPORATION 发明人 DEGERTEKIN FAHRETTIN LEVENT
分类号 G01B5/28;B29C33/40 主分类号 G01B5/28
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