发明名称 |
THIN FILM TRANSISTOR AND CIRCUIT STRUCTURE |
摘要 |
Disclosed are a thin film transistor and a circuit structure. The thin film transistor comprises a gate, a semiconductor layer (101), an etching stop layer, a source electrode (102) and a drain electrode (103), wherein the source electrode and the drain electrode are connected to the semiconductor layer. The thin film transistor further comprises a stopping structure (104) arranged on the etching stop layer. The stopping structure is electrically isolated from the source electrode and the drain electrode, and the orthographic projection of the stopping structure on the etching stop layer and the orthographic projection of the semiconductor layer on the etching stop layer at least partially overlap. Therefore, the drifting characteristic of the threshold voltage of the thin film transistor is improved. |
申请公布号 |
WO2016107099(A1) |
申请公布日期 |
2016.07.07 |
申请号 |
WO2015CN81891 |
申请日期 |
2015.06.19 |
申请人 |
BOE TECHNOLOGY GROUP CO., LTD. |
发明人 |
WANG, XIAOLIN;YAO, XING;UM, YOONSUNG;HAN, SEUNGWOO;IM, YUNSIK |
分类号 |
H01L29/06;H01L29/786 |
主分类号 |
H01L29/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|