发明名称 THIN FILM TRANSISTOR AND CIRCUIT STRUCTURE
摘要 Disclosed are a thin film transistor and a circuit structure. The thin film transistor comprises a gate, a semiconductor layer (101), an etching stop layer, a source electrode (102) and a drain electrode (103), wherein the source electrode and the drain electrode are connected to the semiconductor layer. The thin film transistor further comprises a stopping structure (104) arranged on the etching stop layer. The stopping structure is electrically isolated from the source electrode and the drain electrode, and the orthographic projection of the stopping structure on the etching stop layer and the orthographic projection of the semiconductor layer on the etching stop layer at least partially overlap. Therefore, the drifting characteristic of the threshold voltage of the thin film transistor is improved.
申请公布号 WO2016107099(A1) 申请公布日期 2016.07.07
申请号 WO2015CN81891 申请日期 2015.06.19
申请人 BOE TECHNOLOGY GROUP CO., LTD. 发明人 WANG, XIAOLIN;YAO, XING;UM, YOONSUNG;HAN, SEUNGWOO;IM, YUNSIK
分类号 H01L29/06;H01L29/786 主分类号 H01L29/06
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