Systems and methods for correcting fabrication error in magnetic recording heads using magnetic write width measurements

摘要

Systems and methods for correcting fabrication error in magnetic recording heads using magnetic write width (MWW) measurements are provided. One such method includes separating a wafer into sections containing row bars, each row bar including magnetic recording heads, selecting a first row bar from a first section of the sections, lapping the first row bar to form sliders, performing a test of a magnetic write width (MWW) on each of the sliders, calculating a first error profile for the first row bar based on results of the magnetic write width tests, generating a second error profile for a stripe height of a component of the sliders based on the first error profile, where the component is selected from a magnetic read head and a magnetic write head, and lapping a second row bar from the row bars of the first section using the second error profile.

主权项

1. A method of correcting for fabrication error in magnetic recording heads, the method comprising:
separating a wafer into a plurality of sections, each section containing a plurality of row bars, each row bar comprising a plurality of magnetic recording heads; selecting a first row bar from a plurality of row bars of a first section of the plurality of sections; lapping the first row bar to form a plurality of sliders; performing a test of a magnetic write width (MWW) on each of the plurality of sliders; calculating a first error profile for the first row bar based on results of the magnetic write width tests; generating a second error profile for a stripe height of a component of the plurality of sliders based on the first error profile, wherein the component is selected from the group consisting of a magnetic read head and a magnetic write head; and lapping a second row bar from the plurality of row bars of the first section using the second error profile.