发明名称 Verfahren zur Herstellung ultraduenner Halbleiter-Wafer
摘要 Extremely thin semiconductor wafers are formed by growing an N-conductivity epitaxial layer on an N<+>-type substrate. A Schottky barrier contact is formed on the epitaxial layer and the assembly is immersed in an appropriate fluid for electrolytic etching. Because of differential etch rates as a function of conductivity, and with an appropriate contact voltage, the substrate is selectively dissolved, leaving only the thin epitaxial layer adhered to the contact. The contact is then removed, leaving the epitaxial layer as an independent ultrathin wafer.
申请公布号 DE2130624(A1) 申请公布日期 1971.12.30
申请号 DE19712130624 申请日期 1971.06.21
申请人 WESTERN ELECTRIC CO.INC. 发明人 CALHOUN IRVIN,JOHN
分类号 H01L21/3063 主分类号 H01L21/3063
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