| 摘要 |
An induced electron emission spectrometer wherein different sources are employed to irradiate the sample from different energy sources to permit the operator to distinguish the photoelectron emission lines from the Auger electron emission lines. In one embodiment, the X-ray source employs two different X-ray energy emitting materials with means for selectively energizing one or the other of said materials to irradiate the sample under investigation with selective X-ray energies. In another embodiment the sample is first irradiated with X-rays and thereafter irradiated with electrons. In another embodiment, an X-ray source and then an ultraviolet radiation source are used. |
