发明名称 |
PRODUCTION OF SEMICONDUCTOR |
摘要 |
PURPOSE:To obtain a monocrystaline silicon with a good crystalizing property minimizing defects in the interface with an insulated substrate by annealing with a laser after an amorphous develops near the interface thereof. CONSTITUTION:A silicon ion is implanted near the interface between a sapphire 2 and a silicon 1 of an SOS wafer in which a silicon 1 is grown on a sapphire substrate 2 from the silicon 1 side to form an amorphous region 3. The amount of ion implanted is translated to the amount of the amorphous to be developed near the interface between 1 the silicon 1 and the sapphire 2. A laser beam 20 is irradiated on the SOS wafer from the monocrystaline silicon 1 to effect an annealing. This irradiation of the laser causes a rise in the temperature only near the monocrystaline silicon 1 in the amorphous region 3 whereby a solid phase epitaxial is grown from the silicon single crystal side in the amorphous region 3. |
申请公布号 |
JPS5662335(A) |
申请公布日期 |
1981.05.28 |
申请号 |
JP19790138731 |
申请日期 |
1979.10.29 |
申请人 |
HITACHI LTD |
发明人 |
KOBAYASHI YUTAKA;SUZUKI TAKAYA |
分类号 |
H01L21/20;H01L21/268;H01L21/86 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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