发明名称 SEMICONDUCTOR DEVICE AND ITS MAKING METHOD
摘要 Structures of alternating amorphous layers of titanium and a semiconductor material serve as effective interface layers between an insulator or semiconductor material and an aluminum metallization material in semiconductor devices. Such structures effectively serve to minimize interdiffusion during device manufacture without undue increase in electrical contact resistance during device operation.
申请公布号 KR950007351(B1) 申请公布日期 1995.07.10
申请号 KR19870003318 申请日期 1987.04.08
申请人 AT & T COMPANY 发明人 BRASEN, DANIEL;WILLENS, RONALD H.
分类号 H01L29/43;H01L21/28;H01L21/336;H01L21/768;H01L29/45;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/43
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